Ключевые слова: HTS, YBCO, thin films, fabrication, deposition setup, targets, new, electron beam evaporation, pulsed operation, substrates, temperature dependence, X-ray diffraction, microstructure
Ключевые слова: gravity, sensors, joints superconducting , Nb, electron beam evaporation, welding, joint resistances, fabrication
Ключевые слова: HTS, YBCO, thin films, new, fabrication, electron beam evaporation, pulsed operation, targets, density, microstructure, substrate Si, experimental results
Petrisor T., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Pinto V., Piperno L.
Ключевые слова: HTS, coated conductors, YBCO, substrate Ni-Cu, substrate Ni-W, substrate Ni-W-Cu, buffer layers, fabrication, PLD process, chemical solution deposition, electron beam evaporation, microstructure, heat treatment, annealing process, grain boundaries, films epitaxial, X-ray diffraction, experimental results
Schultz L., Huhne R., Tendeloo G.V., Strickland N.M., Wimbush S.C., Meledin A., Sieger M., Stafford B.H., Ottolinger R.
Ключевые слова: presentation, HTS, coated conductors, fabrication, pilot-scale, GdBCO, substrate Hastelloy, ISD process, PVD process, electropolishing process, electron beam evaporation, buffer layers, microstructure, critical caracteristics, critical current, thickness dependence, contact characteristics, protection layer Ag, control systems
Ключевые слова: MgB2, films, coatings, flux-jump stability, electron beam evaporation, microstructure, magnetization, optical imaging
Ключевые слова: MgB2, films, fabrication, electron beam evaporation, multilayered structures, annealing process, critical caracteristics, Jc/B curves
Ключевые слова: HTS, coated conductors, fabrication, buffer layers, ISD process, texture, electron beam evaporation
Ключевые слова: HTS, REBCO, doping effect, coated conductors, ISD process, fabrication, electron beam evaporation, microstructure, substrate Hastelloy
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Augieri A., Colantoni I., Armenio A.A., Davoli I.
Ключевые слова: HTS, coated conductors, substrate Ni-W, interfaces, oxygenation treatments, YBCO, buffer layers, composition, fabrication, PLD process, electron beam evaporation
Ключевые слова: HTS, coated conductors, substrate Ni-W, buffer layers, high rate process, electron beam evaporation, fabrication, RABITS process, microstructure
Ключевые слова: patents, fabrication, HTS, electron beam evaporation, films, films epitaxial
Ключевые слова: HTS, coated conductors, REBCO, substrate metallic, buffer layers, fabrication, magnetron sputtering, electron beam evaporation, texture
Petrisor T., Ciontea L., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Augieri A., Thalmaier G., Armenio A.A.
Petrisor T., Ciontea L., Galluzzi V., Gambardella U., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Augieri A., Longo G., Cricenti A.
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, PLD process, RABITS process, texture, coatings, buffer layers, electron beam evaporation, microstructure, fabrication, substrate Ni-W
Ключевые слова: presentation, HTS, YBCO, coated conductors, fabrication, TFA-MOD process, fluorine process, electron beam evaporation, Raman spectroscopy, nucleation, microstructure, phase formation, template layers, surface, critical current density, thickness dependence, seed layers, critical caracteristics, measurement technique
Ключевые слова: HTS, YBCO, coated conductors, fabrication, TFA-MOD process, fluorine process, electron beam evaporation, Raman spectroscopy, nucleation, microstructure, phase formation, template layers, surface, critical current density, thickness dependence, seed layers, funding, plans, collaborations, critical caracteristics, measurement technique, presentation
Larbalestier D.C., Singh R.K., Gandikota R., Newman N., Rowell J.M., Shen Y., Hunte F.L., Jaroszynski J.
Lee H.G., Jo W., Hammond R.H., Beasley M.R., Hong G.W., Yoon H.R., Lee R., Cheong H., Yoon S., Huh J.U.
Ginocchio S., Zannella S., Bindi M., Gauzzi A., Rampino S., Gilioli E., Baldini M., Bissoli F., Pattini F.
Kim H.S., Park C., Oh S.S., Ha D.W., Song K.J., Ko R.K., Joo J.H., Moon S.H., Yoo S.I., Yang J.S., Kim H.K., Ha H.S.*21, Jung Y.H., Yoo K.K., Youm D.J.
Ключевые слова: HTS, REBCO, coated conductors, IBAD process, electron beam evaporation, co-evaporation process, composition, substrate cylindrical, fabrication
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, electron beam evaporation, substrate Ni-W, texture, fabrication
Ключевые слова: HTS, coated conductors, substrate Ni-W, buffer layers, electron beam evaporation, YBCO, PLD process, MOD process, magnetization, texture, fabrication, magnetic properties
Ginocchio S., Zannella S., Bindi M., Gauzzi A., Rampino S., Gilioli E., Baldini M., Bissoli F., Pattini F., Rocca M.
Christen D.(christendk@ornl.gov), Storer J., Hammond B.
Moeckly B.H.(bmoeckly@suptech.com), Ruby W.S.
Jo W.(wmjo@ewha.ac.kr)
Nemetschek R., Hoffmann C., Lumkemann A., Sigl G., Prusseit W., Handke J., Kinder H.(h.kinder@lrz.tumuenchen.de)
Doi T., Kitaguchi H.(kitaguchi.hitoshi@nims.go.jp)
Nemetschek R., Hoffmann C., Lumkemann A., Sigl G., Prusseit W., Handke J., Kinder H.(h.kinder@lrz.tumuenchen.de)
Prusseit W.(prusseit@theva.com), Nemetschek R., Hoffmann C., Lumkemann A., Kinder H., Sigl G.
Baldini A., Zannella S., Bindi M., Gauzzi A., Gianni L.(gianni@imem.cnr.it), Rampino S.
Specht E.D., Holesinger T.G., Christen D.K., List F.A., Gapud A.A., Feldmann D.M., Feenstra R.(feenstrar@ornl.gov)
Goyal A., Paranthaman M., Leonard K.J., Sathyamurthy S., Kroeger D.M., Lee D.F.(leedf@ornl.gov), Jr L.H., Yoo J., List F.A., Rutter N., Cook S.W., Martin P.M.
Ключевые слова: HTS, YBCO, coated conductors, substrate SrTiO3, electron beam evaporation, microstructure, phase formation, experimental results, fabrication
Goyal A., Paranthaman M., Heatherly L., Leonard K.J., Kroeger D.M., Lee D.F., List F.A., Martin P.M., Cook S., Gapud A.A., Yoo J.(yooj@ornl.gov), Hsu H.S.
Ключевые слова: coated conductors, buffer layers, fabrication, electron beam evaporation, substrate Ni, HTS, YBCO, microstructure, magnetic properties
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